Description: This environmental scanning electron microscope is equipped with standard high vacuum (HV) operating mode and extended pressure mode (EP). When used in combination with the EP mode, the stage allows for wet samples to be viewed under the electron beam. The EVO 60 also includes a back scatter detector and energy dispersive x-ray spectrographic detector as well as electron back scattered diffraction (EBSD) whose manufacturer is EDAX. The resolving power of the EVO60 is 50nm and the machine is fitted with a tungsten filament. The machine accomodates samples 38.5cm in diameter and 37.5cm in height.
POC: Jim Baughman
E-mail: jim.baughman@nasa.gov
Location: Bldg 1205; Rm 155
Training: Designated Operators
Manufacturer: Zeiss
Model: EVO 60 |
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