SEM-Scanning Electron Microscope-Jeol

Description: Analytical tool used to non-destructively determine the chemical composition of small volumes of solid materials. The sample is bombarded with an electron beam, which emit x-rays with the same characteristics as the element being analyzed. The abundance of elements can then be analyzed at relatively low sample volumes. This Jeol is used for conventional samples of normal size using the airlock. This system can accommodate up to 4 specimen stubs. Has a magnification range from 10x to 300,000x and 30 Angstrom resolution.

POC and Phone #: Sankara Sankaran
E-mail: sankara.sankaran@nasa.gov
Location: Bldg 1205; Rm 151
Manufacturer: Jeol

Description: This SEM utilizes a tungsten filament as the electron source which allows for analytical elemental analysis to be carried out using the attached EDX system. Equipped with a magnification of up to 300,000x and can accommodate a specimen up to 125mm in diameter. Used for spectral, point, and elemental analysis.

POC and Phone #: Joel Alexa 757.864.3143

E-mail: joel.a.alexa@nasa.gov

Location: Bldg 1205; Rm 152
Manufacturer: Philip

Description: The Philips CM200 ST is a versatile instrument that is designed for analysis of the physical, chemical and magnetic microstructure at high spatial resolution. EDS by EDAX, measuring x-rays emiited by the sample, GATAN imaging filter, eels electron energy loss spectrometer, energy imaging, shifted energy imaging, In addition to high resolution imaging capability, the machine is optimized for analytical electron microscopy and Lorentz imaging, under normal and applied magnetic fields. 3 cameras, scanning mode. Spatially resolved compositional analysis by X-ray emission spectroscopy (Z > 5), local electronic structure measurements by electron energy-loss spectroscopy (Z > 2), convergent beam electron diffraction for three-dimensional structure information, and energy-filtered imaging at the nanometer scale are some of the techniques available on this instrument. 2 angstrums. brightfield imaging, 1 million magnification.

POC and Phone #: Joel Alexa
757.864.8721E-mail: robert.a.edahl@nasa.gov
Location: Bldg 1205; Rm 152
Manufacturer: Philip

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