Description: Analyzes material surface characteristics of materials by using an x-ray photoelectric spectrometer equipped with an ultra-high vacuum system. The process initiates with an ion beam striking the surface to clean any residue and then continues when x-rays are emitted by the spectrometer to analyze the composition of the material. The utility of this system stems in its ability to identify molecular arrangement, not just atomic arrange.
POC: Joel Alexa
E-mail: joel.a.alexa@nasa.gov
Location: Bldg 1205; Rm 152
Training: General Access
Manufacturer: Staib
Model: Daysa 100 |
 |
|
