Jeol – JSM 5600 – Scanning Electron Microscope (SEM) | Advanced Materials and Processing Branch

Description: This SEM utilizes a tungsten filament as the electron source which allows for analytical elemental analysis to be carried out using the attached EDX system. Equipped with a magnification of up to 300,000x and can accommodate a specimen up to 125mm in diameter. Used for spectral, point, and elemental analysis.

POC: Joel Alexa
E-mail: joel.a.alexa@nasa.gov
Location: Bldg 1205; Rm 152
Training: Required
Manufacturer: Jeol
Model: JSM 5600

This SEM utilizes a tungsten filament as the electron source which allows for analytical elemental analysis to be carried out using the attached EDX system

Jeol – JSM 5600 – Scanning Electron Microscope (SEM)

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