Description: This machine determines optical constants such as refractive index, n, and extinction coefficient, k. Also measures thickness of thin film samples and data at wavelengths of interest (157nm, 193nm, 248nm, 1550nm, etc.) Sample size limited to films up to 6in in diameter. This machine requires optically transparent or translucent samples and can only fit measurement curve to a database model, so this technique does not serve as a direct measurement for film thickness.
POC: Sang Choi
E-mail: sang.h.choi@nasa.gov
Location: Bldg 1293C; Rm 153E
Training: General Access
Manufacturer: J.A. Woollam
Model: VB-400 VASE |
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